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12 March 2019 266nm pulsed laser damage on UV image intensifier
Yuntao Xie, Xi Wang, Xiaoquan Sun, Xianan Dou
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Proceedings Volume 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application; 110233T (2019) https://doi.org/10.1117/12.2521906
Event: Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 2018, Xi'an, China
Abstract
The damage of a nanosecond pulse laser on ultraviolet(UV) image intensifier was studied. A laser pulsed with a wavelength of 266nm and pulse width of 25ns was used to radiate an UV imager intensifier. The laser induced damage threshold(LIDT) of the internal components of the UV imager intensifier was measured, and the LIDTs of the optical windows, the microchannel plate and the ultraviolet photocathodes are 1.8mJ / cm2 , 3.3mJ / cm2 and 17.6 mJ / cm2, respectively. It is shown that as the incident laser energy increases, the order of damage of the components inside the image intensifier is: photocathode, microchannel plate and optical window.
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Yuntao Xie, Xi Wang, Xiaoquan Sun, and Xianan Dou "266nm pulsed laser damage on UV image intensifier", Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 110233T (12 March 2019); https://doi.org/10.1117/12.2521906
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KEYWORDS
Image intensifiers
Ultraviolet radiation
Laser damage threshold
Laser induced damage
Laser energy
Microchannel plates
Pulsed laser operation
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