4 January 2019 Optical beam deflection method for the diagnostics of nanosuspension
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Proceedings Volume 11024, Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics 2017; 1102406 (2019) https://doi.org/10.1117/12.2314752
Event: Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics 2017, 2017, Taipei, Taiwan
Abstract
The theoretical analysis of the light induced mass transport task was executed in the nanosuspension in a homogeneous light field. As a result of the analytical solution of the light induced mass transport task it was obtained an expression for the deflection angle of the beam in a pseudo-prism. The using of high intensities of the reference beam allows significantly increase the efficiency of the beam deflection method. The results are relevant in the study of the dispersed liquid media, as well as optical diagnostics of such materials.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Valery I. Ivanov, Galina D. Ivanova, Vladimir I. Krylov, and Vladimir K. Khe "Optical beam deflection method for the diagnostics of nanosuspension", Proc. SPIE 11024, Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics 2017, 1102406 (4 January 2019); doi: 10.1117/12.2314752; https://doi.org/10.1117/12.2314752
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