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4 January 2019 Metrological performance of integrated waveguide-based SPR refractometer: eigenmode expansion perspective
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Proceedings Volume 11024, Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics 2017; 110240K (2019) https://doi.org/10.1117/12.2315445
Event: Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics 2017, 2017, Taipei, Taiwan
Abstract
The waveguide-based SPR refractometer is studied using state-of-the-art photonic simulation software based on eigenmode expansion method. Two distinct coupling regimes between the waveguide mode and surface plasmon mode are identified. Operating the refractometer in different spectral ranges to measure different values of the ambient refractive index is considered and its metrological performance under different modes of operation is assessed.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anton V. Dyshlyuk, Oleg B. Vitrik, and Yuri N. Kulchin "Metrological performance of integrated waveguide-based SPR refractometer: eigenmode expansion perspective", Proc. SPIE 11024, Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics 2017, 110240K (4 January 2019); https://doi.org/10.1117/12.2315445
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