Spatial selectivity and sensitivity measurement of optoelectronic devices by scanning microscopy

Urs Zywietz; Sercan Çabuk; Mosaddek Hossain; Thorsten Beuth

doi:10.1117/12.2522265

11 April 2019 Spatial selectivity and sensitivity measurement of optoelectronic devices by scanning microscopy

Urs Zywietz, Sercan Çabuk, Mosaddek Hossain, Thorsten Beuth

Proceedings Volume 11028, Optical Sensors 2019; 110282I (2019) https://doi.org/10.1117/12.2522265
Event: SPIE Optics + Optoelectronics, 2019, Prague, Czech Republic

Abstract

Avalanche Photodetectors (APDs) with high dynamic ranges are tested with scanning microscopy to reveal their sensitivity towards the components optoelectronic spatial design. The measurement will unveil design flaws of typical APD design approaches and suggest improvements. In the end, the specification of the component will be discussed under the issued findings. optical induced current.

Citation Download Citation

Urs Zywietz, Sercan Çabuk, Mosaddek Hossain, and Thorsten Beuth "Spatial selectivity and sensitivity measurement of optoelectronic devices by scanning microscopy", Proc. SPIE 11028, Optical Sensors 2019, 110282I (11 April 2019); https://doi.org/10.1117/12.2522265

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available