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11 April 2019 Spatial selectivity and sensitivity measurement of optoelectronic devices by scanning microscopy
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Abstract
Avalanche Photodetectors (APDs) with high dynamic ranges are tested with scanning microscopy to reveal their sensitivity towards the components optoelectronic spatial design. The measurement will unveil design flaws of typical APD design approaches and suggest improvements. In the end, the specification of the component will be discussed under the issued findings. optical induced current.
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Urs Zywietz, Sercan Çabuk, Mosaddek Hossain, and Thorsten Beuth "Spatial selectivity and sensitivity measurement of optoelectronic devices by scanning microscopy", Proc. SPIE 11028, Optical Sensors 2019, 110282I (11 April 2019); https://doi.org/10.1117/12.2522265
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