Terahertz quantitative metrology using 300 GHz in-line digital holography

Min Wan; Hui Yuan; Dovilė Čibiraitė; Derek Cassidy; Alvydas Lisauskas; John J. Healy; Hartmut G. Roskos; Viktor Krozer; John T. Sheridan

doi:10.1117/12.2520787

23 April 2019 Terahertz quantitative metrology using 300 GHz in-line digital holography

Min Wan, Hui Yuan, Dovilė Čibiraitė, Derek Cassidy, Alvydas Lisauskas, John J. Healy, Hartmut G. Roskos, Viktor Krozer, John T. Sheridan

Author Affiliations +

Proceedings Volume 11030, Holography: Advances and Modern Trends VI; 110300R (2019) https://doi.org/10.1117/12.2520787
Event: SPIE Optics + Optoelectronics, 2019, Prague, Czech Republic

Abstract

Continuous-wave THz digital holography (DH) is an advanced interference imaging technique, which can be used to reconstruct the amplitude and phase distributions of a sample. In this paper, an in-line holographic system is presented using a 300 GHz source and a highly sensitive broadband CMOS TeraFET (THz Field-Effect Transistor) detector. Numerical reconstruction is achieved using the angular spectrum approach. Experimental results are presented for a sample made of Polyvinyl Chloride (PVC). The results demonstrate that THz digital holography can be readily applied to perform quantitative metrology and may find many applications in 3D digital imaging and microscopy.

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Min Wan, Hui Yuan, Dovilė Čibiraitė, Derek Cassidy, Alvydas Lisauskas, John J. Healy, Hartmut G. Roskos, Viktor Krozer, and John T. Sheridan "Terahertz quantitative metrology using 300 GHz in-line digital holography ", Proc. SPIE 11030, Holography: Advances and Modern Trends VI, 110300R (23 April 2019); https://doi.org/10.1117/12.2520787

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