PROCEEDINGS VOLUME 11038
SPIE OPTICS + OPTOELECTRONICS | 1-4 APRIL 2019
X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V
Proceedings Volume 11038 is from: Logo
SPIE OPTICS + OPTOELECTRONICS
1-4 April 2019
Prague, Czech Republic
Front Matter: Volume 11038
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 1103801 (5 August 2019); doi: 10.1117/12.2535700
Facility Reports, Status Updates and FEL Schemes I
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 1103803 (24 April 2019); doi: 10.1117/12.2522912
Facility Reports, Status Updates and FEL Schemes II
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380F (14 May 2019); doi: 10.1117/12.2522966
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380G (14 May 2019); doi: 10.1117/12.2520990
X-ray Optics and Wavefront diagnostics I
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380J (14 May 2019); doi: 10.1117/12.2526134
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380L (24 April 2019); doi: 10.1117/12.2526647
X-ray Optics and Wavefront Diagnostics II
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380M (24 April 2019); doi: 10.1117/12.2522256
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380N (14 May 2019); doi: 10.1117/12.2523254
Time-Domain Diagnostics and FEL Instrumentation
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380Q (24 April 2019); doi: 10.1117/12.2520974
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380R (24 April 2019); doi: 10.1117/12.2526119
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380S (24 April 2019); doi: 10.1117/12.2522716
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380U (14 May 2019); doi: 10.1117/12.2526289
Poster Session
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380W (24 April 2019); doi: 10.1117/12.2522609
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380X (24 April 2019); doi: 10.1117/12.2524104
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 1103810 (24 April 2019); doi: 10.1117/12.2520827
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 1103812 (24 April 2019); doi: 10.1117/12.2520334
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