Single-shot temporal characterization of XUV FEL pulses (Conference Presentation)

Stefan Düsterer

doi:10.1117/12.2526289

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14 May 2019 Single-shot temporal characterization of XUV FEL pulses (Conference Presentation)

Stefan Düsterer

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Proceedings Volume 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V; 110380U (2019) https://doi.org/10.1117/12.2526289
Event: SPIE Optics + Optoelectronics, 2019, Prague, Czech Republic

Abstract

Results of single-shot temporal characterization of ultra-short XUV pulses generated by the free-electron laser FLASH will be presented. Using a THz field-driven streaking setup, the limits of this technique were investigated by employing different pulse durations from sub 10 fs to 350fs and different XUV wavelengths. Limits and possible error sources of the diagnostic method are discussed. Furthermore, the single-shot XUV pulse duration measurement allows the detailed investigation of the interplay between different properties of the strongly fluctuating self-amplified spontaneous emission (SASE) radiation. Correlations between pulse duration, pulse energy, spectral distribution, arrival time and electron bunch shapes are explored in the experimental data as well as in simulations. Finally, an outlook on how such a system can be implemented as online photon diagnostic will be presented.

Conference Presentation

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Stefan Düsterer "Single-shot temporal characterization of XUV FEL pulses (Conference Presentation)", Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380U (14 May 2019); https://doi.org/10.1117/12.2526289

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