Homogeneity of SiO2:TiO2 waveguide films fabricated via sol-gel method

Paweł Karasiński

doi:10.1117/12.2522257

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15 March 2019 Homogeneity of SiO₂:TiO₂ waveguide films fabricated via sol-gel method

Paweł Karasiński

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Proceedings Volume 11045, Optical Fibers and Their Applications 2018; 1104506 (2019) https://doi.org/10.1117/12.2522257
Event: 18th Conference on Optical Fibers and Their Applications, 2018, Naleczow, Poland

Abstract

Optical layers produced from liquid phase are susceptible to the occurrence of refractive index inhomogeneity. The presented work involves the determination of refractive index inhomogeneity in waveguide layers, using the envelope of the recorded reflectance spectrum. Appropriate formulas and the calculation procedure have been demonstrated. The determined refractive indices are used to calculate theoretical reflectance characteristics which are compared with the experimental characteristics. In this way, the determination correctness of refractive indices on layer boundaries is verified. The calculations of theoretical reflectance characteristics were carried out with the use of the transfer matrix 2×2 formalism. Excellent agreement of both characteristics has been obtained.

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Paweł Karasiński "Homogeneity of SiO₂:TiO₂ waveguide films fabricated via sol-gel method", Proc. SPIE 11045, Optical Fibers and Their Applications 2018, 1104506 (15 March 2019); https://doi.org/10.1117/12.2522257

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