Approaches for a destructive measurement method of subsurface damages (Conference Presentation)

Michael Seiler

doi:10.1117/12.2537877

16 August 2019 Approaches for a destructive measurement method of subsurface damages (Conference Presentation)

Michael Seiler

Proceedings Volume 11056, Optical Measurement Systems for Industrial Inspection XI; 110561I (2019) https://doi.org/10.1117/12.2537877
Event: SPIE Optical Metrology, 2019, Munich, Germany

Abstract

This Conference Presentation, "Approaches for a destructive measurement method of subsurface damages," was recorded at SPIE Optical Metrology 2019 held in Munich, Germany.

Conference Presentation

Citation Download Citation

Michael Seiler "Approaches for a destructive measurement method of subsurface damages (Conference Presentation)", Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110561I (16 August 2019); https://doi.org/10.1117/12.2537877

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