Setup and evaluation of a static imaging Fourier transform spectrometer for the mid-infrared spectral range

Michael H. Köhler; The Thien Nguyen; Patrick Kienle; Xingchen Dong; Alexander W. Koch

doi:10.1117/12.2525600

21 June 2019 Setup and evaluation of a static imaging Fourier transform spectrometer for the mid-infrared spectral range

Michael H. Köhler, The Thien Nguyen, Patrick Kienle, Xingchen Dong, Alexander W. Koch

Author Affiliations +

Proceedings Volume 11056, Optical Measurement Systems for Industrial Inspection XI; 110561P (2019) https://doi.org/10.1117/12.2525600
Event: SPIE Optical Metrology, 2019, Munich, Germany

Abstract

Hyperspectral imaging is an established technique for process analysis capturing a two-dimensional spatial image and the spectral information for each pixel simultaneously. When moderate spectral resolution is sufficient, static imaging Fourier transform spectrometers (sIFTS) can offer a viable alternative to their scanning counterparts in the mid-infrared spectral range. Therefore, in this paper we present a sIFTS concept based on a single-mirror interferometer which shows no internal light losses and still works with extended light sources, achieving sufficient signal-to-noise ratios. The interferometer consists of a beam splitter, a plane mirror and a lens, which makes it both inexpensive and relatively easy to adjust. For a proof of principle we present a transmission measurement setup including a light source module, imaging optics and a single-mirror interferometer. The system achieves a spectral resolution of 12 cm⁻¹ in a spectral range from 2700 cm⁻¹ to 800 cm⁻¹ , respectively from 3.7 μm to 13 μm. The spatial resolution amounts to about 10.10 lp/mm, the results for a sample containing different polymers show good agreement with a laboratory FTIR spectrometer.

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Michael H. Köhler, The Thien Nguyen, Patrick Kienle, Xingchen Dong, and Alexander W. Koch "Setup and evaluation of a static imaging Fourier transform spectrometer for the mid-infrared spectral range", Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110561P (21 June 2019); https://doi.org/10.1117/12.2525600

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