High-order transmissive diffraction grating for high-resolution spectral systems

V. I. Kazakov; O. D. Moskaletz; M. A. Vaganov

doi:10.1117/12.2526004

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21 June 2019 High-order transmissive diffraction grating for high-resolution spectral systems

V. I. Kazakov, O. D. Moskaletz, M. A. Vaganov

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Proceedings Volume 11057, Modeling Aspects in Optical Metrology VII; 110571G (2019) https://doi.org/10.1117/12.2526004
Event: SPIE Optical Metrology, 2019, Munich, Germany

Abstract

A mathematical model of the spectral transform implemented in a diffraction grating spectral device based on the principles of radio optics, the system approach and the theory of linear systems is presenter in paper. The model is based on a sequential describing of the optical signal conversion by all elements of the device. The rejection of the principles of geometric optics when describing the operation of the device is argued. The proposed model in a strict mathematical form allows to establish important properties of the spectra in various diffraction orders: a nonlinear relationship of the spatial and frequency scale and a multiple improvement in the spectral resolution with an increase in the number of the diffraction order. In addition, a method has been established for improving the resolution of the device by applying diffraction gratings with a modified topology of the location of the strokes, which makes it possible to increase the intensity of the diffracted light into higher diffraction orders. Changing the topology consist in location of the strokes at not at an equidistant distance, i.e. introduction of spatial modulation. The results of computer simulation of a diffraction grating with the proposed topology and calculations of the theoretically achievable resolution of device with such grating are presented. A comparison is made between ordinary and high-order diffraction gratings according to their efficiency.

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V. I. Kazakov, O. D. Moskaletz, and M. A. Vaganov "High-order transmissive diffraction grating for high-resolution spectral systems", Proc. SPIE 11057, Modeling Aspects in Optical Metrology VII, 110571G (21 June 2019); https://doi.org/10.1117/12.2526004

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