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21 June 2019 Automatized fine-focusing in digital microscopy
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Proceedings Volume 11062, Digital Optical Technologies 2019; 110621I (2019) https://doi.org/10.1117/12.2525421
Event: SPIE Digital Optical Technologies, 2019, Munich, Germany
Abstract
This paper proposes a procedure for automatized fine-focusing of particles’ image in digital microscopy. First, analytical formulas for a calculation of axial defocus are derived using the complex amplitude propagation. Afterwards, the formulas are used for a design of an iterative algorithm for the fine-focusing. Uncertainty analysis and error simulations are then presented. In the final part of the paper, the method is verified by a simple experimental setup. The proposed strategy can find utilisation in many practical applications of automatized processes, not only in digital microscopy.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Petr Pokorný, Filip Šmejkal, Pavel Novák, Jirí Novák, and Antonín Mikš "Automatized fine-focusing in digital microscopy", Proc. SPIE 11062, Digital Optical Technologies 2019, 110621I (21 June 2019); https://doi.org/10.1117/12.2525421
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