An advanced test station has been developed to test integrated focal plane array (FPA) hardware. This test system is intended to test readouts, sensor chip assemblies (SCAs), modules, and complete FPAs. The test station was developed in response to existing and anticipated project requirements that exceed the performance capabilities of existing test stations. A new generation test station will require enhanced performance, such as the ability to accommodate increased data rates, generate lower noise drive electronics, and provide improved diagnostic capability. The goal was to develop a test vehicle that was configurable enough to accommodate the projected FPA test requirements for the next several years, thereby eliminating the need for a new design test station for each individual program. Two types of programs were considered when specifying the new test station: development programs where a substantial amount of diagnostic and analysis capability are required, and production programs where test time and ease of use are critical. If a flexible test station design could be achieved, the nonrecurring costs to implement a new program could be greatly reduced, both in test equipment design and in training test personnel. Since the goal of the CDATS program was to develop a test station that could be reproduced for many projects, the recurring cost of this test station should also be reasonable. The CDATS system is, we believe, a low cost system capable of being configured or easily modified to test most current and future FPA components.