25 September 1989 Short Wavelength Infrared Test And Evaluation System
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Abstract
A new short wavelength infrared (SWIR) focal plane measurement facility at the Naval Ocean Systems Center is described. The following aspects of the system are discussed: spectral response measurement, noise spectral density measurement, frequency response measurement, and cryogenic Dewars.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jerome S. Hughes, Robert K. Creber, "Short Wavelength Infrared Test And Evaluation System", Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960671; https://doi.org/10.1117/12.960671
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