25 September 1989 Short Wavelength Infrared Test And Evaluation System
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Abstract
A new short wavelength infrared (SWIR) focal plane measurement facility at the Naval Ocean Systems Center is described. The following aspects of the system are discussed: spectral response measurement, noise spectral density measurement, frequency response measurement, and cryogenic Dewars.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jerome S. Hughes, Jerome S. Hughes, Robert K. Creber, Robert K. Creber, } "Short Wavelength Infrared Test And Evaluation System", Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960671; https://doi.org/10.1117/12.960671
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