20 September 1989 An Apparatus For Measuring The Specular Reflectance Of Optical Components At Cryogenic Temperatures
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Abstract
A unique apparatus for measuring the specular reflectance of bare and anti-reflection coated optical components, at cryogenic temperatures, has been developed through a joint effort between the Metrology Department and the Electro-Optical Center of Rockwell International Corporation's Autonetics Electronics Systems Division, in Anaheim, California. An invention disclosure for the apparatus has been filed with Rockwell.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John F. Gerhard, John F. Gerhard, Ronald D. Bigelow, Ronald D. Bigelow, } "An Apparatus For Measuring The Specular Reflectance Of Optical Components At Cryogenic Temperatures", Proc. SPIE 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking, (20 September 1989); doi: 10.1117/12.960738; https://doi.org/10.1117/12.960738
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