Transmission Measurement Of Optical Components At Cryogenic Temperatures

John F. Gerhard

doi:10.1117/12.960739

20 September 1989 Transmission Measurement Of Optical Components At Cryogenic Temperatures

John F. Gerhard

Proceedings Volume 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking; (1989) https://doi.org/10.1117/12.960739
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

Rockwell International Corporation Metrology, in Anaheim, California, has implemented a unique capability for measuring the transmission of plane optical components at cryogenic temperatures. This capability supports Rockwell's Electro-Optical Center in the manufacturing and testing of short- and long-wave IR detectors designed to operate at low thermal background levels.

Citation Download Citation

John F. Gerhard "Transmission Measurement Of Optical Components At Cryogenic Temperatures", Proc. SPIE 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking, (20 September 1989); https://doi.org/10.1117/12.960739

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