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The planning and construction of new and upgraded x-ray synchrotron light sources and free-electron lasers [1], in the last decade, has urged the need for advanced x-ray optics and promoted a rapid development of advanced software tools and packages for X-ray optics simulation and design. The focus of this development has evolved from individual optical components to start-to-end simulation packages (such as SRW [2]) integrating the computation of the source, optical elements, samples and the detection system. To take full advantage of the new sources, modern x-ray optical systems become more complex including e.g., adaptive optics whose performance heavily relies on the level of perfection of their mechanical, thermal and control systems. This successively demands the development of new simulation framework and software (such as OASYS [3]) to allow interoperability between different tools and physical models. A successful approach to the modern optical design requires not only the ability to integrate multiple optical components, but also the integration of different levels of simulation [4] including analytical formulas, numerical ray-tracing or wavefront propagation, and mutual coherence propagation. These simulations need to take into account the integration of the optical, mechanical and thermal properties of the system, as well as the prediction of the instrumental response at the experimental station to evaluate the overall quality of the optical layout or setup. Simulations could also be used to drive real control systems, by reverse processing of real-time data to interpolate the feedback signals. In this presentation, we will review the status of x-ray optics simulation with examples, and highlight future directions.
[1] Eriksson, M., Van Der Veen, J. F., & Quitmann, C. J. Synchrotron Rad., 21, 837 (2014).
[2] Chubar, O., Rakitin, M. S., Chen-Wiegart, Y.-C., Fluerasu, A., & Wiegart, L. Proc. SPIE, 10388, 1038811 (2017).
[3] Rebuffi, L., & Sanchez del Rio, M. Proc. SPIE, 10388, 103880S (2017).
[4] Shi, X., Reininger, R., Harder, R., & Haeffner, D. Proc. SPIE, 10388, 103880C (2017).
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