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Transfer of autocollimator calibration for use with scanning gantry profilometers for accurate determination of surface slope and curvature of state-of-the-art x-ray mirrors
Slope error correction of bendable gratings with an in-situ long trace profiler for the soft x-ray beamline at National Synchrotron Radiation Research Center (NSRRC) (Conference Presentation)
Three-dimensional shape measurement of an ellipsoidal mirror by industrial x-ray computed tomography
Beam size measurement for XFEL nanobeam using intensity interferometer of x-ray fluorescence (Conference Presentation)
On the characterization of ultra-precise XUV-focusing mirrors by means of slope- measuring deflectometry