High-speed characterization of refractive lenses with single-grating interferometry

Xianbo Shi; Walan Grizolli; Deming Shu; Luca Rebuffi; Zahirul Islam; Lahsen Assoufid

doi:10.1117/12.2529886

9 September 2019 High-speed characterization of refractive lenses with single-grating interferometry

Xianbo Shi, Walan Grizolli, Deming Shu, Luca Rebuffi, Zahirul Islam, Lahsen Assoufid

Proceedings Volume 11109, Advances in Metrology for X-Ray and EUV Optics VIII; 111090K (2019) https://doi.org/10.1117/12.2529886
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

Compound refractive lenses (CRLs) are widely used as focusing optics at X-ray synchrotron beamlines. For example, the Advanced Photon Source Upgrade (APS-U) beamlines will utilize a large number of CRLs. These lenses must be of high quality to preserve the wavefront and coherence properties of the new source. Therefore, they must be evaluated for quality control and performance before installation and use. At the APS, singlegrating Talbot interferometry has been the primary at-wavelength characterization method because of its high speed, and the ability to provide accurate, quantitative measurements. However, even though the measurement of a single lens is fast, the characterization of a large number of lenses is time consuming due to the time spent on mounting and alignment of individual samples. To adapt the method for testing large quantities of lenses, a fast evaluation system was developed, which includes the use of a lens cartridge for rapid sample change and alignment and an automated python script for batch data analysis. In this work, the optical specifications of refractive lenses are discussed. Measurement and data analysis procedures are also shown in details for testing individual lenses.

Conference Presentation

Citation Download Citation

Xianbo Shi, Walan Grizolli, Deming Shu, Luca Rebuffi, Zahirul Islam, and Lahsen Assoufid "High-speed characterization of refractive lenses with single-grating interferometry", Proc. SPIE 11109, Advances in Metrology for X-Ray and EUV Optics VIII, 111090K (9 September 2019); https://doi.org/10.1117/12.2529886

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