Undulator radiation brightness calculations in the Sirepo GUI for SRW

B. Nash; O. Chubar; D. L. Bruhwiler; M. Rakitin; P. Moeller; R. Nagler; N. Goldring

doi:10.1117/12.2530663

9 September 2019 Undulator radiation brightness calculations in the Sirepo GUI for SRW

B. Nash, O. Chubar, D. L. Bruhwiler, M. Rakitin, P. Moeller, R. Nagler, N. Goldring

Proceedings Volume 11110, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VII; 111100K (2019) https://doi.org/10.1117/12.2530663
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The brightness and coherence of modern light sources is pushing the limits of X-ray beamline design. The open source Synchrotron Radiation Workshop (SRW) provides physical optics based algorithms for correctly simulating such beamlines.¹ We present new SRW capabilities to calculate source brightness and related quantites for undulators. The Sirepo cloud computing framework^{2, 3} includes a browser-based GUI for SRW.^4–6 In addition to high-accuracy wavefront simulations, the Sirepo interface now supports analytical calculations for flux, photon beam size, divergence and photon brightness. We have included the effects of detuning from resonance and electron beam energy spread, which can be important in realistic operational conditions. We compare our results to features previously available in the Igor Pro interface to SRW, to analytical formulae available in the literature, and also to the results of simulated wavefront propagation. Differences between the various approaches are explained in detail, so that all the assumptions, conventions and ranges of validity can be better understood.

Conference Presentation

Citation Download Citation

B. Nash, O. Chubar, D. L. Bruhwiler, M. Rakitin, P. Moeller, R. Nagler, and N. Goldring "Undulator radiation brightness calculations in the Sirepo GUI for SRW", Proc. SPIE 11110, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VII, 111100K (9 September 2019); https://doi.org/10.1117/12.2530663

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available