X-ray Fourier ptychography for out-of-focus measurements

Klaus Wakonig; Ana Diaz; Sabina Chiriotti; Anna Bergamaschi; Anne Bonnin; Marco Stampanoni; Andreas Menzel

doi:10.1117/12.2528905

9 September 2019 X-ray Fourier ptychography for out-of-focus measurements

Klaus Wakonig, Ana Diaz, Sabina Chiriotti, Anna Bergamaschi, Anne Bonnin, Marco Stampanoni, Andreas Menzel

Proceedings Volume 11112, X-Ray Nanoimaging: Instruments and Methods IV; 111120I (2019) https://doi.org/10.1117/12.2528905
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

Transmission microscopes have become a valuable tool for hard X-ray imaging. They allow even complex in situ and operando setups to be realized. However, the objective lens, typically a Fresnel zone plate with a high numerical aperture, is commonly a limiting factor. The small working distance as well as the low efficiency of Fresnel zone plates with high numerical apertures restrict setups either to accommodate specific sample environments or to provide high resolution. Lensless imaging techniques, e.g. ptychography, do not suffer from such adverse effects of Fresnel zone plates. Consequently, they are frequently used for high-resolution X-ray imaging. A recently developed method, X-ray Fourier ptychography aims to combine the benefits of both techniques. It has been shown to provide quantitative high-resolution imaging whilst keeping large working distances for in situ and operando setups. This is achieved by acquiring multiple images with a full-field transmission microscope, each at a different lateral position of the Fresnel zone plate. Moving the objective off the optical axis varies the frequency content for the acquisitions. The resulting dataset is numerically combined using well-established phase retrieval algorithms to recover a complex-valued representation of the sample. Here, we demonstrate how Fourier ptychographic phase retrieval can further be used to mitigate artifacts caused by samples that were placed out of focus, as well as misaligned optical elements. Employing a similar approach to increase the contrast in case of weakly absorbing specimens is also envisioned.

Citation Download Citation

Klaus Wakonig, Ana Diaz, Sabina Chiriotti, Anna Bergamaschi, Anne Bonnin, Marco Stampanoni, and Andreas Menzel "X-ray Fourier ptychography for out-of-focus measurements", Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 111120I (9 September 2019); https://doi.org/10.1117/12.2528905

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KEYWORDS

X-rays

Objectives

X-ray imaging

Sensors

Microscopes

Zone plates

Image resolution

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