Paper
15 October 2019 Recent trends in high-resolution hard x-ray tomography
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Abstract
Hard X rays are the probe of choice to three-dimensionally visualize optically opaque hard and soft objects as well as their combinations without physical cutting. The currently available methods allow for the quantification of the real and the imaginary parts of local refractive indices. The related phase- and absorption-contrast data are often complementary. The datasets are of GB or TB size due to the object's size and the selected spatial resolution. Therefore the related quantification is challenging. Nevertheless, the current developments pave the way towards imaging larger and larger objects with true micro- and nanometer resolution. Since 1997, the SPIE conference on Developments in X-ray Tomography, which was established by U. Bonse, has set the benchmark in the dissemination of knowledge between experts in instrumentation, software development, and a variety of applications. This paper summarizes key aspects of the contributions in the current volume.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bert Müller "Recent trends in high-resolution hard x-ray tomography", Proc. SPIE 11113, Developments in X-Ray Tomography XII, 1111302 (15 October 2019); https://doi.org/10.1117/12.2530085
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KEYWORDS
Tomography

X-rays

Photons

Synchrotron radiation

Tissues

Hard x-rays

Image segmentation

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