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9 September 2019 The Keck Planet Imager and Characterizer: demonstrating advanced exoplanet characterization techniques for future extremely large telescopes (Conference Presentation)
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Abstract
The Keck Planet Imager and Characterizer (KPIC) is an upgrade to the Keck II adaptive optics system enabling high contrast imaging and high-resolution spectroscopic characterization of giant exoplanets in the mid-infrared (2-5 microns). The KPIC instrument will be developed in phases. Phase I entails the installation of an infrared pyramid wavefront sensor (PyWFS) based on a fast, low-noise SAPHIRA IR-APD array. The ultra-sensitive infrared PyWFS will enable high contrast studies of infant exoplanets around cool, red, and/or obscured targets in star forming regions. In addition, the light downstream of the PyWFS will be coupled into an array of single-mode fibers with the aid of an active fiber injection unit (FIU). In turn, these fibers route light to Keck's high-resolution infrared spectrograph NIRSPEC, so that high dispersion coronagraphy (HDC) can be implemented for the first time. HDC optimally pairs high contrast imaging and high-resolution spectroscopy allowing detailed characterization of exoplanet atmospheres, including molecular composition, spin measurements, and Doppler imaging. We will provide an overview of the instrument, its science scope, and report on recent results from on-sky commissioning of Phase I. We will discuss plans for optimizing the instrument to seed designs for similar modes on extremely large telescopes.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nemanja Jovanovic, Jacques-Robert Delorme, Charlotte Z. Bond, Sylvain Cetre, Dimitri Mawet, Daniel Echeverri, James K. Wallace, Randy Bartos, Scott Lilley, Sam Ragland, Garreth Ruane, Peter Wizinowich, Mark Chun, Ji Wang, Jason Wang, Michael Fitzgerald, Jacklyn Pezzato, Keith Matthews, Ben Calvin, Maxwell Millar-Blanchaer, Emily C. Martin, Edward Wetherell, Eric Wang, Shane Jacobson, Eric Warmbier, Charles Lockhart, Don Hall, Rebecca Jensen-Clem, and Eden McEwen "The Keck Planet Imager and Characterizer: demonstrating advanced exoplanet characterization techniques for future extremely large telescopes (Conference Presentation)", Proc. SPIE 11117, Techniques and Instrumentation for Detection of Exoplanets IX, 111170T (9 September 2019); https://doi.org/10.1117/12.2529330
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