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9 September 2019 Life testing of conventional and atomic layer deposition functionalized microchannel plates
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Abstract
We report on life testing of conventional microchannel plates (MCPs) and atomic layer deposition (ALD) MCPs. For the Global-scale Observations of the Limb and Disk (GOLD) mission, long-duration, deep charge extraction testing was performed on a Z-stack triplet of 12 μm pore conventional MCPs with a CsI photocathode on the top surface. A relatively low gain (≈1000e-), modest charge extraction (0.07 C/cm2) full-field conditioning burn-in was performed followed by a very deep narrow line burn-in to emulate a GOLD spectral line. The gain local to the line burn-in decreased by ≈20% over ≈1 C/cm2 of extracted charge, and then remained stable (to 95 C/cm2). We also present the performance of several sets of 20 μm pore ALD MCPs with MgO secondary electron emission layers through full-field conditioning burn-ins at both full gain and low gain.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jason B. McPhate, Nathan T. Darling, Travis L. Curtis, Catriana Paw U, Casey Vo, Gillean Graves, Oswald H. W. Siegmund, and Camden Ertley "Life testing of conventional and atomic layer deposition functionalized microchannel plates", Proc. SPIE 11118, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXI, 111180P (9 September 2019); https://doi.org/10.1117/12.2529517
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