11 October 1989 Measurement Of The Refractive-Index Structure Parameter By Incoherent Aperture Scintillation Techniques
Author Affiliations +
Abstract
The current status of large aperture scintillation techniques for refractive index structure parameter measurement is reviewed, instrument design considerations and limitations are discussed, and a new incoherent aperture profiling system is described.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerard R. Ochs, Gerard R. Ochs, } "Measurement Of The Refractive-Index Structure Parameter By Incoherent Aperture Scintillation Techniques", Proc. SPIE 1115, Propagation Engineering, (11 October 1989); doi: 10.1117/12.960863; https://doi.org/10.1117/12.960863
PROCEEDINGS
9 PAGES


SHARE
Back to Top