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17 May 2019 The study of optical statistical properties and coherence for XFEL
Yuhuan Dou, Shuai Liu, Xiaojian Shu, Xiaozhong He, Yiding Li, Linwen Zhang
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Proceedings Volume 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019); 1117011 (2019) https://doi.org/10.1117/12.2532688
Event: Fourteenth National Conference on Laser Technology and Optoelectronics, 2019, Shanghai, China
Abstract
A X-ray free-electron laser (XFEL) facility is based on RF superconducting accelerator at China Academy of Engineering Physics (CAEP) has been planed. The facility will be designed in a radiation range of 0.3-4 angstrom and the electron beam energy will be 12GeV. The main work focuses on the optimization of different parameters through physical analysis such as the undulator peak field strength and electron beam energy selected. A detailed simulation of start up and statistical properties of the radiation from a SASE FEL operating has been performed by time dependent FEL code.
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Yuhuan Dou, Shuai Liu, Xiaojian Shu, Xiaozhong He, Yiding Li, and Linwen Zhang "The study of optical statistical properties and coherence for XFEL", Proc. SPIE 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019), 1117011 (17 May 2019); https://doi.org/10.1117/12.2532688
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KEYWORDS
Free electron lasers
Statistical analysis
X-rays
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