ESD problems in embedded systems

K. Krosman; J. Sosnowski

doi:10.1117/12.2536623

6 November 2019 ESD problems in embedded systems

K. Krosman, J. Sosnowski

Proceedings Volume 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019; 111761V (2019) https://doi.org/10.1117/12.2536623
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 2019, Wilga, Poland

Abstract

Mitigating failures caused by electrostatic discharge (ESD) is a crucial problem in many applications of embedded systems. The paper analyses in a systematic way the propagation of ESD effects at structural and logical levels in order to find threats and capabilities of efficient system recovery. The presented considerations are illustrated with some results referred to commercially developed devices for registering and analyzing ECG signals.

Citation Download Citation

K. Krosman and J. Sosnowski "ESD problems in embedded systems", Proc. SPIE 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 111761V (6 November 2019); https://doi.org/10.1117/12.2536623

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available