The analysis of sensitivity and nonlinearity parameters of selected signal conditioners for resistance measurement

Wojciech Walendziuk; Tomasz Siegieda; Anna Maria Dąbrowska

doi:10.1117/12.2536476

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6 November 2019 The analysis of sensitivity and nonlinearity parameters of selected signal conditioners for resistance measurement

Wojciech Walendziuk, Tomasz Siegieda, Anna Maria Dąbrowska

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Proceedings Volume 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019; 111765J (2019) https://doi.org/10.1117/12.2536476
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 2019, Wilga, Poland

Abstract

One of the most important issues in the field of measurement techniques is measurement of resistance. This work focuses on the presentation of metrological properties of selected resistance measurement systems such as Voltage Divider, Wheatstone Bridge and Double Current Circuit. All the systems can be also used as simple and easy to use circuits for basic signal conditioners for resistance measurement. The performed analysis will be based on simulation and measurement tests of real electrical systems. In this paper, the sensitivity and non-linearity of selected resistance measurement systems will be analyzed.

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Wojciech Walendziuk, Tomasz Siegieda, and Anna Maria Dąbrowska "The analysis of sensitivity and nonlinearity parameters of selected signal conditioners for resistance measurement", Proc. SPIE 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 111765J (6 November 2019); https://doi.org/10.1117/12.2536476

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