26 October 1989 Contamination Control Program For The Extreme Ultraviolet Explorer Instruments
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Abstract
We present a contamination control program that has been developed for the optical components of the Extreme Ultraviolet Explorer (EUVE) satellite, whose performance in the 80-900 Å wavelength range is highly sensitive to particulate and molecular contamination. The specification for the optical components has been set at less than 10 particles greater than 25 microns (μm), and less than 1.0 microgram non-volatile residue (NVR) per square centimeter at instrument end-of-life. We discuss a variety of contamination control approaches and monitoring methods used throughout our project to characterize possible causes of contamination of EUV optics, and to develop cleanliness requirements for use during the design, fabrication, and test phases of the EUVE instrumentation. The contamination control approach includes isolating the sensitive optical components in an 'o'-ring sealed optics cavity that is kept sealed from the time of delivery to NASA until deployment on orbit. Monitoring methods and devices used prior to launch include thermal quartz crystal microbalances, particle and NVR witness plates, direct sampling from flight hardware, and optical witness samples to monitor EUV reflectivity and scattering. A mass transfer model which has been used to predict instrument contamination trends during the two-year mission in a 500-km altitude space environment is also discussed.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David C. Ray, David C. Ray, Roger F. Malina, Roger F. Malina, Barry Y. Welsh, Barry Y. Welsh, James D. Austin, James D. Austin, Bonnie Gray Teti, Bonnie Gray Teti, } "Contamination Control Program For The Extreme Ultraviolet Explorer Instruments", Proc. SPIE 1118, Space Optical Materials and Space Qualification of Optics, (26 October 1989); doi: 10.1117/12.960956; https://doi.org/10.1117/12.960956
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