A new phase analysis method using mean intensity on speckle interferometry for measuring dynamic phenomena

Kyoma Takahashi; Shuichi Arikawa

doi:10.1117/12.2542764

16 October 2019 A new phase analysis method using mean intensity on speckle interferometry for measuring dynamic phenomena

Kyoma Takahashi, Shuichi Arikawa

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Proceedings Volume 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019); 1120507 (2019) https://doi.org/10.1117/12.2542764
Event: Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 2019, Phuket, Thailand

Abstract

A new phase analysis method using mean intensity values on electronic speckle pattern interferometry is proposed for measuring dynamic phenomena with variations of the mean intensity and the modulation amplitude values. In this method, phase differences are calculated by least-squares in kernels using interfered intensity values and mean intensity values of laser speckle pattern images on series deformation states. The interfered images and the mean intensity images are captured simultaneously for each state. For the phase difference calculation, initial phase values are required only for first step. The initial phases are obtained by another phase analysis method. The effectiveness of the proposed method is evaluated using simulation images. As a result, it is verified that the high accuracy phase analysis is possible under the situation with variations of the mean intensity and the modulation amplitude values. Additionally, an interferometer that two images, the interfered speckle image and the mean intensity image, are captured on a single image on a single camera is constructed for measuring displacement distribution. Experiments are then performed for validating availability of the proposed method.

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Kyoma Takahashi and Shuichi Arikawa "A new phase analysis method using mean intensity on speckle interferometry for measuring dynamic phenomena", Proc. SPIE 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 1120507 (16 October 2019); https://doi.org/10.1117/12.2542764

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KEYWORDS

Phase shift keying

Modulation

Speckle pattern

Interferometry

Speckle interferometry

Beam splitters

Fourier transforms

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