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3 October 2019 Quantitative imaging of advanced nanostructured materials with scattering-type scanning near field optical microscopy
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Proceedings Volume 11207, Fourth International Conference on Applications of Optics and Photonics; 112071K (2019) https://doi.org/10.1117/12.2527401
Event: IV International Conference on Applications of Optics and Photonics (AOP 2019), 2019, Lisbon, Portugal
Abstract
Scattering-type Scanning Near Field Optical Microscopy (s-SNOM) has been demonstrated as a valuable tool for revealing important properties of materials at nanoscale. Recent proof-of-concept experiments have shown that, among others, s-SNOM can provide quantitative information on the real and imaginary parts of the dielectric function, and hence of intrinsic optical properties of materials and biological samples. In this work we further explored these capabilities in several experiments dealing with microcapsules for drug delivery, ultra-thin optical coatings with tunable color properties, and two types of nanoparticles with important applications in energy storage and conversion, or biosensing and theranostics.
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Stefan G. Stanciu, Denis E. Tranca, Laura Pastorino, Stefania Boi, Young Min Song, Young Jin Yoo, Satoshi Ishii, Fang Yang, Aiguo Wu, Radu Hristu, and George A. Stanciu "Quantitative imaging of advanced nanostructured materials with scattering-type scanning near field optical microscopy", Proc. SPIE 11207, Fourth International Conference on Applications of Optics and Photonics, 112071K (3 October 2019); https://doi.org/10.1117/12.2527401
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