Paper
3 October 2019 Reliability of ridge waveguide distributed feedback lasers for communications applications: from device specification and failure analysis to life-time calculation
Horacio I. Cantú, Giovanni Giuliano, Andrew McKee
Author Affiliations +
Proceedings Volume 11207, Fourth International Conference on Applications of Optics and Photonics; 112072H (2019) https://doi.org/10.1117/12.2530545
Event: IV International Conference on Applications of Optics and Photonics (AOP 2019), 2019, Lisbon, Portugal
Abstract
In this work, we describe how, from the early stages of device characterization, it is possible to evaluate the suitability of a given device design for the long life-time demand of a challenging deployment environment (uncooled, non-hermetic operation). Understanding the reasons for non-compliance and device failure, as well as their clear association with the device fabrication procedure steps, greatly helps to systematically improve the device quality yield for volume production.
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Horacio I. Cantú, Giovanni Giuliano, and Andrew McKee "Reliability of ridge waveguide distributed feedback lasers for communications applications: from device specification and failure analysis to life-time calculation", Proc. SPIE 11207, Fourth International Conference on Applications of Optics and Photonics, 112072H (3 October 2019); https://doi.org/10.1117/12.2530545
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KEYWORDS
Reliability

Failure analysis

Waveguides

Statistical analysis

Waveguide lasers

Laser applications

Semiconductor lasers

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