3 April 1989 Rough Surface Classification Using Irradiance Moments
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Proceedings Volume 1121, Interferometry '89; (1989) https://doi.org/10.1117/12.961255
Event: Interferometry '89, 1989, Warsaw, Poland
Abstract
An hybrid optical-digital processor using the phase-shifting interferometry and Fourier analysis that computes irradiance moments of rough samples is presented. An example is described to illustrate the performance of these moment functions in roughness classification.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christophe Gorecki, Christophe Gorecki, } "Rough Surface Classification Using Irradiance Moments", Proc. SPIE 1121, Interferometry '89, (3 April 1989); doi: 10.1117/12.961255; https://doi.org/10.1117/12.961255
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