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9 March 2020 Directly measuring spectrometer resolution from excess noise correlations (Conference Presentation)
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Abstract
Spectral resolution is a crucial parameter in spectral / Fourier domain Optical Coherence Tomography (OCT). The sensitivity roll-off is determined by the spectral resolution, while depth-dependent axial resolution changes are caused by spectral resolution variations with wavelength. Currently, spectral resolution assessment is performed using either a narrow linewidth light source or broadband interferometry. Although commonly used, these methods require either additional components or time-consuming procedures. Here, we present a simple method to directly measure the spectral resolution at all wavelengths based on excess noise correlations. We apply this method to a visible light OCT system and validate it against interferometry.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aaron M. Kho, Tingwei Zhang, Conrad W. Merkle, and Vivek J. Srinivasan "Directly measuring spectrometer resolution from excess noise correlations (Conference Presentation)", Proc. SPIE 11228, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXIV, 1122818 (9 March 2020); https://doi.org/10.1117/12.2542444
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