Presentation
9 March 2020 Rapid non-linear image scanning microscopy (Conference Presentation)
Author Affiliations +
Abstract
Recently, we have developed Image Scanning Microscopy (ISM) that doubles the resolution of a conventional confocal microscope by replacing the confocal pinhole with an imaging detector. Here, we describe theory and realization of a new fully optical non-linear ISM suitable for two-photon excited fluorescence and second-harmonic generation. It provides excellent sensitivity and high frame-rate in combination with two-times improved lateral resolution compared to a conventional two-photon laser-scanning microscope. We demonstrate the performance using fixed and living specimen, as well as hydrogels. The modular design allows straight-forward implementation into existing microscopes. We also present a cost-efficient FLIM-ISM detector providing super-resolved fluorescence lifetime images using two-photon excitation and can be implemented into any confocal microscope.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ingo Gregor, Jörg Enderlein, and Robert Ros "Rapid non-linear image scanning microscopy (Conference Presentation)", Proc. SPIE 11244, Multiphoton Microscopy in the Biomedical Sciences XX, 112440D (9 March 2020); https://doi.org/10.1117/12.2541142
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KEYWORDS
Microscopy

Multiphoton microscopy

Super resolution

Confocal microscopy

Fluorescence lifetime imaging

Microscopes

Second-harmonic generation

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