Adaptive atomic force microscope

Patrick D. Schmidt; Benjamin H. Reichert; John G. Lajoie; Sanjeevi Sivasankar

doi:10.1117/12.2545261

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13 February 2020 Adaptive atomic force microscope

Patrick D. Schmidt, Benjamin H. Reichert, John G. Lajoie, Sanjeevi Sivasankar

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Proceedings Volume 11246, Single Molecule Spectroscopy and Superresolution Imaging XIII; 1124604 (2020) https://doi.org/10.1117/12.2545261
Event: SPIE BiOS, 2020, San Francisco, California, United States

Abstract

Commercial atomic force microscope (AFM) solutions do not typically lend themselves to easy integration into a wide range of optical microscope platforms. Here we present a custom AFM platform which is readily integrated into an FPGA controlled fluorescence microscope and is easily programmed for a variety of unique applications. Our collimated laser design allows for an adjustable sensitivity depending on the range of forces required, and the large range piezo (100μm in all three dimensions) presents the freedom to perform precise measurement and manipulation in a high throughput manner, over a broad range of distances. We demonstrate a high bandwidth of 1MHz with low noise levels of less than 71pN at full bandwidth and below 6pN at a relevant bandwidth of 1kHz.

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Patrick D. Schmidt, Benjamin H. Reichert, John G. Lajoie, and Sanjeevi Sivasankar "Adaptive atomic force microscope", Proc. SPIE 11246, Single Molecule Spectroscopy and Superresolution Imaging XIII, 1124604 (13 February 2020); https://doi.org/10.1117/12.2545261

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