Paper
21 February 2020 Peak force infrared microscopy for label-free chemical imaging at sub 10 nm spatial resolution
Le Wang, Guanghong Zeng, Gilbert C. Walker, Xiaoji G. Xu
Author Affiliations +
Abstract
Chemical characterization of materials at the nanoscale provides insights into their compositions and organizations. Infrared spectroscopy has been a powerful tool that directly indicates the identity and amount of functional groups of molecules by measuring the absorption of infrared light. However, nanoscale spatial resolution is hard to achieve for conventional Fourier-transform infrared (FTIR) spectroscopy because of the optical diffraction limit. Herein we reported a recently developed infrared microscopy and spectroscopy technique also based on infrared absorption of molecules – peak force infrared microscopy – that combines atomic force microscopy and infrared laser illumination. Sub 10 nanometer spatial resolution has been demonstrated on various samples, including block copolymers, hexagonal boron nitride flakes, and amyloid fibrils. Simultaneous chemical and mechanical mapping can be obtained with peak force infrared microscopy in that both information is encoded in the cantilever deflection curves during peak force tapping cycles. The high spatial resolution and multimodal measurement capability render peak force infrared microscopy a label-free chemical imaging technique for explorations of nanoscale across broad disciplines.
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Le Wang, Guanghong Zeng, Gilbert C. Walker, and Xiaoji G. Xu "Peak force infrared microscopy for label-free chemical imaging at sub 10 nm spatial resolution", Proc. SPIE 11252, Advanced Chemical Microscopy for Life Science and Translational Medicine, 112521L (21 February 2020); https://doi.org/10.1117/12.2541976
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KEYWORDS
Microscopy

Infrared microscopy

Infrared radiation

Spatial resolution

Polaritons

Atomic force microscopy

Imaging spectroscopy

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