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10 March 2020 The importance of statistics for photoluminescence quantum yield measurements (Conference Presentation)
Felix Fries, Heidi Thomas, Max Gmelch, Tim Achenbach, Sebastian Reineke
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Proceedings Volume 11277, Organic Photonic Materials and Devices XXII; 1127708 (2020) https://doi.org/10.1117/12.2540033
Event: SPIE OPTO, 2020, San Francisco, California, United States
Abstract
Measuring the photoluminescence quantum yield (PLQY) is a method often used within numerous fields of luminescent material science. Determining its absolute value relies on counting photons and hence, it is a very sensitive technique. Therefore, systematic errors that may occur during the measurement are discussed widely. However, the statistical uncertainty within those measurements remains mainly unconsidered. Here, we propose a new way of data analyses that exploits multiple measurements and a subsequent evaluation using the weighted mean. This leads in an efficient way to a very low statistical uncertainty. Additionally, time-dependent influences on the measurement can be identified that way.
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Felix Fries, Heidi Thomas, Max Gmelch, Tim Achenbach, and Sebastian Reineke "The importance of statistics for photoluminescence quantum yield measurements (Conference Presentation)", Proc. SPIE 11277, Organic Photonic Materials and Devices XXII, 1127708 (10 March 2020); https://doi.org/10.1117/12.2540033
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KEYWORDS
Luminescence
Quantum efficiency
Error analysis
Photons
Statistical analysis
Classification systems
Data analysis
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