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28 February 2020 Optical dispersion study of PPDT2FBT by spectroscopic ellipsometry
Chandan Howlader, Mehedhi Hasan, Alexander Zakidov, Maggie Yihong Chen
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Proceedings Volume 11277, Organic Photonic Materials and Devices XXII; 1127712 (2020) https://doi.org/10.1117/12.2545426
Event: SPIE OPTO, 2020, San Francisco, California, United States
Abstract
In recent years, PPDT2FBT is getting researchers’ attention due to its applications in solar cells and optoelectronic devices. Although the main applications of this material are based on the optical properties. However, the optical dispersion of this material has not been studied yet over the UV and visible spectral range. We report the optical properties of PPDT2FBT for the wavelength range of 300 nm to 900 nm using a variable angle spectroscopic ellipsometry (SE). The refractive index (n) and extinction coefficient (k) of spin coated PPDT2FBT thin films were determined at room temperature. Glass of known optical properties was used as the substrates for convenience. To build an optical model the surface morphology was studied using atomic force microscopy (AFM). Then an optical model was developed based on the extracted properties. The optical properties were found to be consistent with the UV-Vis data. The bandgap was estimated from the absorption properties. Finally, the developed ellipsometry model was used for thickness measurement of PPDT2FBT thin films. The measured data agreed well with the data collected using other direct thickness measurement techniques of the same thin film. This developed model can be useful for designing effective optoelectronic devices as well as measuring the thickness of thin films in a nondestructive way.
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Chandan Howlader, Mehedhi Hasan, Alexander Zakidov, and Maggie Yihong Chen "Optical dispersion study of PPDT2FBT by spectroscopic ellipsometry", Proc. SPIE 11277, Organic Photonic Materials and Devices XXII, 1127712 (28 February 2020); https://doi.org/10.1117/12.2545426
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KEYWORDS
Refractive index
Thin films
Optical properties
Spectroscopic ellipsometry
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