Paper
5 March 2020 Epitaxial growth of β-Ga2O3/ε-Ga2O3 polymorphic heterostructures on c-plane sapphire for deep-ultraviolet optoelectronics
Author Affiliations +
Proceedings Volume 11281, Oxide-based Materials and Devices XI; 112810G (2020) https://doi.org/10.1117/12.2544427
Event: SPIE OPTO, 2020, San Francisco, California, United States
Abstract
Thin polymorphic gallium oxide films were grown on c-plane sapphire using pulsed laser deposition. The stacked thin films (ε-Ga2O3 and β-Ga2O3) were sequentially grown under the same conditions but in a different ambience. Our X-ray diffraction measurements and transmission electron microscopy images confirmed a β-Ga2O3/ε-Ga2O3 polymorphic heterostructure with rocking-curve widths of 1.4° (β-Ga2O3 (¯603)) and 0.6° (ε-Ga2O3 (006)). The crystallographic orientation relationships between c-plane sapphire and the heterogeneously nucleated ε-Ga2O3 buffer layer, as well as between the ε-Ga2O3 and β-Ga2O3 heterogeneous layers, were determined. Our study will aid in developing novel deep-ultraviolet optoelectronic devices, such as solar-blind and metal-insulator-semiconductor deep-ultraviolet photodiodes.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nasir Alfaraj, Kuang-Hui Li, Chun Hong Kang, Laurentiu Braic, Tien Khee Ng, and Boon S. Ooi "Epitaxial growth of β-Ga2O3/ε-Ga2O3 polymorphic heterostructures on c-plane sapphire for deep-ultraviolet optoelectronics", Proc. SPIE 11281, Oxide-based Materials and Devices XI, 112810G (5 March 2020); https://doi.org/10.1117/12.2544427
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KEYWORDS
Crystals

Gallium

Heterojunctions

Sapphire

Deep ultraviolet

Argon

Transmission electron microscopy

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