Optical refractive index (RI) sensors exploiting selective co-integration of plasmonics with silicon photonics in Lab-on-achip configurations are expected to disrupt Point-of-Care (POC) diagnostics, delivering performance and economic breakthroughs. Propagating surface-plasmon-polariton modes offer superior sensitivity due to their extreme overlap with the surrounding medium. In parallel, low-loss photonics act as the hosting platform with which the plasmonic losses can be sustained while allowing for multiplexed layouts via in-plane SPP excitation schemes. However, merging plasmonics with silicon photonics in a cost-effective manner, requires a truly CMOS-compatible manufacturing process. Herein, we demonstrate experimentally, the highest bulk-sensitivity among all the plasmo-photonic interferometric RI sensors, while taking the leap forward in the development of a CMOS-manufactured plasmo-photonic sensing platform merging Si3N4 photonics and aluminum plasmonics. The proposed structure relies on a butt-coupled interface between Si3N4 waveguides and a 70 μm long plasmonic stripe, deployed in one branch of a Mach-Zehnder Interferometer (MZI) serving as the sensing transducer that detects local changes in the refractive index. The lower MZI arm (reference arm) exploits the low-loss Si3N4 platform to deploy a MZI-based variable optical attenuator followed by a thermo-optic phase shifter to optimize the sensor performance achieving resonance extinction ratio values at the MZI output of more than 35 dB. Experimental evaluation of a gold-based sensor revealed a bulk refractive index sensitivity of 1930 nm/RIU. In addition, we experimentally demonstrate that the proposed plasmo-photonic waveguide platform can migrate from gold (Au) to Aluminum (Al), demonstrating the first step towards a fully CMOS compatible plasmo-photonic interferometric sensor.