CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11292 > Article
Presentation
10 March 2020 High NA silicon metalenses for wide-field imaging (Conference Presentation)
Thomas F. Krauss
Author Affiliations +
Proceedings Volume 11292, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XIII; 112920B (2020) https://doi.org/10.1117/12.2550557
Event: SPIE OPTO, 2020, San Francisco, California, United States
Abstract
This Conference Presentation, "High NA silicon metalenses for wide-field imaging," was recorded at Photonics West 2020 held in San Francisco, California, United States.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Thomas F. Krauss "High NA silicon metalenses for wide-field imaging (Conference Presentation)", Proc. SPIE 11292, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XIII, 112920B (10 March 2020); https://doi.org/10.1117/12.2550557
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 PRESENTATION
WATCH
PRESENTATION SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
KEYWORDS
Silicon
Imaging systems
Lenses
Miniature imaging systems
Monochromatic aberrations
Nanostructures
Refractive index
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top