PROCEEDINGS VOLUME 11296
SPIE OPTO | 1-6 FEBRUARY 2020
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
IN THIS VOLUME

36 Sessions, 38 Papers, 61 Presentations
Proceedings Volume 11296 is from: Logo
SPIE OPTO
1-6 February 2020
San Francisco, California, United States
Front Matter: Volume 11296
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129601 (19 March 2020); doi: 10.1117/12.2570051
Quantum Sensing, Spin Squeezing, and Related Technologies I
Atomic Clocks, Atomic Interferometers, and Enabling Technologies I
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129607 (25 February 2020); doi: 10.1117/12.2552540
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129608 (25 February 2020); doi: 10.1117/12.2552625
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129609 (25 February 2020); doi: 10.1117/12.2552587
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960A (9 March 2020); doi: 10.1117/12.2545583
Quantum Sensing, Spin Squeezing, and Related Technologies II
Quantum Sensing, Spin Squeezing, and Related Technologies III
Quantum Sensing, Spin Squeezing, and Related Technologies IV
Atomic Clocks, Atomic Interferometers, and Enabling Technologies II
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960P (9 March 2020); doi: 10.1117/12.2552608
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960Q (27 March 2020); doi: 10.1117/12.2552626
Atomic Clocks, Atomic Interferometers, and Enabling Technologies III
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960S (27 March 2020); doi: 10.1117/12.2552627
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960W (25 February 2020); doi: 10.1117/12.2544847
Atomic Clocks, Atomic Interferometers, and Enabling Technologies IV
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960X (27 March 2020); doi: 10.1117/12.2552651
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960Y (9 March 2020); doi: 10.1117/12.2553118
Quantum Sensing, Spin Squeezing, and Related Technologies V
Quantum Sensing, Spin Squeezing, and Related Technologies VI
New Laser Technologies for Precision Metrology and Sensing
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961C (25 February 2020); doi: 10.1117/12.2552645
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961E (27 March 2020); doi: 10.1117/12.2552566
Atomic Clocks, Atomic Interferometers, and Enabling Technologies V
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961G (27 March 2020); doi: 10.1117/12.2552689
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961H (25 February 2020); doi: 10.1117/12.2552695
Atomic Clocks, Atomic Interferometers, and Enabling Technologies VI
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961K (17 March 2020); doi: 10.1117/12.2552667
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961L (27 March 2020); doi: 10.1117/12.2552681
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961M (25 February 2020); doi: 10.1117/12.2552698
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961N (25 February 2020); doi: 10.1117/12.2552696
Atomic Metrology: New Directions
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961O (25 February 2020); doi: 10.1117/12.2552585
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961P (27 March 2020); doi: 10.1117/12.2552592
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961R (25 February 2020); doi: 10.1117/12.2552611
Optomechanics and Force Detection I
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112961W (27 March 2020); doi: 10.1117/12.2552543
Fiber Optics Sensing, Metrology, and Related Technologies
Optomechanics and Force Detection II
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129622 (27 March 2020); doi: 10.1117/12.2552682
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129624 (27 March 2020); doi: 10.1117/12.2552691
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129625 (27 March 2020); doi: 10.1117/12.2552692
Frequency Combs
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129627 (27 March 2020); doi: 10.1117/12.2552555
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129628 (27 March 2020); doi: 10.1117/12.2552622
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962A (25 February 2020); doi: 10.1117/12.2552656
Tests of Fundamental Physics I
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962B (9 March 2020); doi: 10.1117/12.2543592
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962E (27 March 2020); doi: 10.1117/12.2552628
Tests of Fundamental Physics II
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962F (27 March 2020); doi: 10.1117/12.2552550
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962G (27 March 2020); doi: 10.1117/12.2552589
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962H (25 February 2020); doi: 10.1117/12.2549377
Gravitational Wave Detection and Related Technologies
Slow and Fast Light in Cavities, Resonators, and Waveguides
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962N (9 March 2020); doi: 10.1117/12.2552580
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962O (25 February 2020); doi: 10.1117/12.2540476
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962P (17 April 2020); doi: 10.1117/12.2552658
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962Q (27 March 2020); doi: 10.1117/12.2552659
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112962S (25 February 2020); doi: 10.1117/12.2552688
Quantum Information Processing and Related Technologies I
Gyroscopes and Precision Rotation Sensing I
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129630 (9 March 2020); doi: 10.1117/12.2547876
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129631 (25 February 2020); doi: 10.1117/12.2552686
Gyroscopes and Precision Rotation Sensing II
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129635 (27 March 2020); doi: 10.1117/12.2552588
Gyroscopes and Precision Rotation Sensing III
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129639 (25 February 2020); doi: 10.1117/12.2552572
Precision Magnetometry and Enabling Technologies
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112963C (25 February 2020); doi: 10.1117/12.2553244
Integrated/Chip Scale Sensing and Related Technologies I
Integrated/Chip Scale Sensing and Related Technologies II
Integrated/Chip Scale Sensing and Related Technologies III
Optical Metrology: New Developments I
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112963U (27 March 2020); doi: 10.1117/12.2552574
Optical Metrology: New Developments II
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112963W (25 February 2020); doi: 10.1117/12.2552602
Optical Metrology: New Developments III
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129644 (17 March 2020); doi: 10.1117/12.2546495
Quantum Information Processing and Related Technologies II
Quantum Information Processing and Related Technologies III
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