Experimental realization of robust weak measurements

Enrico Rebufello; Fabrizio Piacentini; Alessio Avella; M. A. de Souza; Marco Gramegna; Jan Dziewior; Eliahu Cohen; Lev Vaidman; Ivo P. Degiovanni; Marco Genovese

doi:10.1117/12.2542097

25 February 2020 Experimental realization of robust weak measurements

Enrico Rebufello, Fabrizio Piacentini, Alessio Avella, M. A. de Souza, Marco Gramegna, Jan Dziewior, Eliahu Cohen, Lev Vaidman, Ivo P. Degiovanni, Marco Genovese

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Proceedings Volume 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II; 112964B (2020) https://doi.org/10.1117/12.2542097
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

Despite being very influential on both foundations and applications of quantum mechanics, weak values are still somewhat controversial. Although there are some indications that weak values are physical properties of a single quantum system, the common way weak values are presented is statistical: it is commonly believed that for measuring weak values one has to perform many weak measurements over a large ensemble of pre- and postselected particles. Other debates surround the anomalous nature of weak value and even their quantumness. To address these issues, we present some preliminary data showing that anomalous weak values can be measured using just a single detection, i.e. with no statistics. In our experiment, a single click of a detector indicates the weak value as a single photon property, which moreover lies well beyond the range of eigenvelues of the measured operator. Importantly, the uncertainty with which the weak values is measured is smaller than the difference between the weak value and the closet eigenvalue. This is the first experimental realization of robust weak measurements.

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Enrico Rebufello, Fabrizio Piacentini, Alessio Avella, M. A. de Souza, Marco Gramegna, Jan Dziewior, Eliahu Cohen, Lev Vaidman, Ivo P. Degiovanni, and Marco Genovese "Experimental realization of robust weak measurements", Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112964B (25 February 2020); https://doi.org/10.1117/12.2542097

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