Paper
16 March 2020 Dual layer x-ray detector simulation
Author Affiliations +
Abstract
We report on the modeling, characterization, benchmarking, and optimization of an interventional cone beam CT system based on a dual layer X-ray detector by means of physics based simulations.

By Monte Carlo methods, we log the interaction and dose deposition (i.e. signal generation) of X-ray photons in the dual layer geometry, including scattering processes and fluorescence photon emission. From the spatial dose distribution inside the detection volume, we derive typical detector properties like X-ray spectral responses, detective quantum efficiencies 𝐷𝑄𝐸(0), and noise characteristics for particular detector layouts.

We apply these results in subsequent full system simulations to generate 3D imaging scans of dual layer spectral projections, for custom virtual phantoms containing inserts of e.g. blood sediment or iodine with different concentrations. These simulated images are used to calculate key performance indicators of the imaging system, like e.g. receiver operating characteristic based analysis of material separation capabilities.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Klaus Juergen Engel, Bernd Menser, Pierre Rohr, Walter Ruetten, Matthias Simon, and Axel Thran "Dual layer x-ray detector simulation", Proc. SPIE 11312, Medical Imaging 2020: Physics of Medical Imaging, 113121O (16 March 2020); https://doi.org/10.1117/12.2549633
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photons

Sensors

X-rays

X-ray detectors

Monte Carlo methods

Iodine

Scattering

Back to Top