Paper
16 March 2020 Pixel-defect corrections for radiography detectors based on deep learning
Eunyeong Hong, Songhee Kang, Eunae Lee, Namjo Yoo, Jae Young Choi, Dong Sik Kim
Author Affiliations +
Abstract
Flat-panel radiography detectors employ the thin film transistor (TFT) panels to acquire high-quality x-ray images. Pixel defects in the TFT panel can degrade the image quality and lower the production yield of the panel, and ultimately increase the production cost. Hence, developing an appropriate defect correction algorithm for acquired images is important. Conventional algorithms are based on statistical learning and hence optimizing their performances is difficult especially for image edge parts. To alleviate this problem, a template matching technique can be used. In this paper, we considered various pixel-defect correction algorithms based on deep learning techniques, such as the artificial neural network (ANN), convolutional neural network (CNN), and generative adversarial networks, and compared their performances. The defect-correction performances are compared using practical x-ray images acquired from general radiography detectors. A concatenate CNN showed the best defect-correction performance. We also showed that a single-layer ANN could conduct an efficient defect correction in terms of both correction and computational complexity performances.
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Eunyeong Hong, Songhee Kang, Eunae Lee, Namjo Yoo, Jae Young Choi, and Dong Sik Kim "Pixel-defect corrections for radiography detectors based on deep learning", Proc. SPIE 11312, Medical Imaging 2020: Physics of Medical Imaging, 113124E (16 March 2020); https://doi.org/10.1117/12.2549684
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KEYWORDS
Sensors

Gallium nitride

Radiography

Detection and tracking algorithms

X-rays

Convolution

X-ray imaging

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