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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in Ninth International Symposium on Precision Mechanical Measurements, edited by Liandong Yu, Proceedings of SPIE Vol. 11343 (SPIE, Bellingham, WA, 2019) Seven-digit Article CID Number. ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510634589 ISBN: 9781510634596 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445 Copyright © 2019, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $21.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/19/$21.00. Printed in the United States of America by Curran Associates, Inc., under license from SPIE. Publication of record for individual papers is online in the SPIE Digital Library.
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AuthorsNumbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B...0Z, followed by 10-1Z, 20-2Z, etc. Bao, Fengqing, 0G Bian, Dian, 0I Cai, Yindi, 20 Cao, Cong, 04, 05 Cao, Jiaming, 10 Chang, Yaqi, 0I Chen, Cancan, 15 Chen, Guoyu, 09 Chen, Haixiu, 0U, 0X Chen, Runbo, 12 Chen, Shuoyi, 11 Chen, Weijie, 0G Chen, Ze-Yuan, 06 Cheng, Jie, 0I Cheng, Qiangqiang, 0R Cheng, Rongjun, 0J, 0S Cheng, Xuemin, 1L Cheng, Yinbao, 0K, 0L Cui, Changcai, 0H, 0O, 27 Cui, Hao, 02 Cui, Lu-fei, 1G Dai, Jie, 0M Dai, Tianliang, 0Z Deng, JiaYi, 1Q Deng, Jinjun, 12 Dou, Mengmeng, 04 Du, Han, 1K Du, Yijun, 21 Fan, FeiFei, 1Q Fan, Kuangchao, 14, 20 Fan, Wei, 1K Fang, Chuanzhi, 0J Fang, Shi-xue, 06 Fang, Xiuzhi, 07 Feng, Baokai, 20 Feng, Shuai, 1D, 1J, 1M Feng, Xugang, 07 Feng, Yu, 26 Feng, Zhihua, 0F Fu, Huadong, 0K, 0L Gao, Guanbin, 0P Gao, Haoran, 0I Gao, Shenping, 1Y Gao, Sitian, 08 Gao, Tiande, 12 Gao, Yuzhang, 25 Gao, Zhonghua, 1W Gu, Junlan, 1R Gui, Lin, 16, 19 Guo, Bin, 1X Guo, Chengcheng, 1Y Guo, Hua, 0H Han, Liang, 0V Hao, Qun, 1L He, Ming-zhao, 1V He, Tao, 09 Hou, Yan, 0U, 0X Hu, Biao, 0R Hu, Bo, 22, 24 Hu, Fang, 1B Hu, Penghao, 0V Hu, XiaoFeng, 1I Hu, Xiaohao, 0N Huang, Lingxiang, 19 Huang, Lu, 08 Huang, Qiangxian, 0J, 0S, 14 Huang, Wenbin, 18 Huang, Xiaohui, 2A Huang, Yao, 1S Ji, Fang, 23 Jia, Huakun, 10 Jia, Minqiang, 05 Jiang, Chengyu, 12 Jiang, Wensong, 0N, 0Q Jiang, Yizhou, 0C Jin, Shiqun, 02 Jing, Qi, 23 Kang, ChuanShuai, 0B Lei, Xianqing, 0A Li, Cheng, 09 Li, Dongsheng, 1O Li, Feng-jun, 0D Li, Hongli, 0J Li, Huihui, 0H Li, Jian, 22, 23 Li, Jian-shuang, 1T, 1V Li, Jianyuan, 22, 24 Li, Jiaying, 1X Li, Li, 13 Li, Ling, 0K, 0L Li, Mei-Xuan, 28 Li, Pengxia, 1W Li, Ping, 1V Li, Qi, 08 Li, Rui, 10 Li, Ruijun, 14 Li, Shaoliang, 03 Li, Shi, 08 Li, Wei, 08 Li, Weixian, 1H Li, Xin, 1H Li, Yifan, 1O Li, Yihua, 1Q Li, Zhishuai, 0U, 0X Lin, Yonghong, 17, 1Z Ling, Qihui, 0W, 16 Liu, Fei, 0P Liu, Guangmin, 23, 24 Liu, Hai, 15 Liu, Ji, 2A Liu, Jie, 0U, 0X Liu, Ming, 06 Liu, Qi, 0N Liu, Shida, 0C Liu, Xiaoyu, 21 Lu, Xiaolong, 21 Luo, Jian, 12 Luo, Zai, 0N, 0Q, 1F, 1I, 1X Lv, Zhongyan, 0B Lyu, Jing, 0K, 0L Ma, Binghe, 12 Ma, Dan, 06 Mei, Jian, 0J Miao, Dong-jing, 1N, 1T Mou, Chuan, 29 Na, Jing, 0P Nan, Zhuojiang, 26 Niu, Zhenqi, 03 Ou, Jiahao, 17, 1Z Pan, Chengliang, 0F, 0Z Pang, Yongjun, 13 Peng, Dong-lin, 0D Peng, Hu, 1D, 1J, 1M Peng, Siping, 03 Qi, Yuhai, 0S Qiao, H. Y., 1M Qiao, Tiezhu, 25 Qing, Yaoyao, 1A, 1C Qu, Bao-hua, 0D, 0E Qu, Xinghua, 1E Ren, Huan, 1Q Sang, Qi, 20 Shi, Chao, 0Z Shi, Yushu, 08 Shu, Chao, 1A, 1C Song, Pengcheng, 0S Song, Wanting, 1F Tang, Chuxin, 0V Tang, Pei, 1Q Tang, Qi-fu, 0E Tang, Shoufeng, 15 Tang, Ying, 05 Tang, Yingqi, 1F Tao, Wei, 26 Tian, Porui, 1O Wan, Jialuo, 1W Wang, Chaoqun, 0J Wang, Chuanli, 09 Wang, Dongxia, 0B Wang, Fan, 1S Wang, Hanbin, 0K Wang, Haoran, 15 Wang, Jiangtao, 02 Wang, Liyan, 0M Wang, Rong, 1U Wang, Xian, 0W, 16, 17, 1B, 1Z Wang, Xiaobo, 1Y Wang, Xiaoyi, 0A Wang, Xinrui, 1N Wang, Xuan-ze, 06 Wang, Y., 0Y Wang, Yang-yang, 0D, 0E Wang, Yonghong, 0G Wang, Yuebing, 1Y Wang, Zhongyu, 0K, 0L, 0Q Wei, Yongmei, 1D, 1J Wei, Yuzhao, 02 Wen, Xiulan, 0B Wu, Delin, 1Y Wu, Fan, 1H Wu, Jun, 0L Wu, Liang, 29 Wu, Shuangle, 0G Wu, Sijin, 1H Xia, Guisuo, 0R Xia, Guo, 02 Xia, Haojie, 0Z Xiao, Zhao, 19 Xiong, Mei-jun, 1G Xu, Hui, 12 Xu, Peng, 14 Xu, Xueyang, 03 Xu, Zhang, 25 Xu, Zhenying, 1K, 1R, 1U Xue, Haifeng, 0U Xue, Zi, 1N, 1S Yan, Lei, 1L Yan, Yuchao, 12 Yang, Binhe, 20 Yang, Cheng, 27 Yang, Fei, 0F Yang, Hongtao, 13 Yang, Mingdai, 1B Yang, Rongguang, 0M Yang, Xuebing, 1B Yao, Lei, 1Y Yao, X. J., 0Y Ye, Jing, 0R Yu, Cao-feng, 1G Yu, Jiahua, 0O Yu, Jing, 1I Yu, Liandong, 0C, 0I, 0Z, 10 Yu, Lixia, 2A Yuan, Weiran, 22, 24 Yue, Longlong, 0J Zeng, Bing, 0W, 16 Zhang, Binbin, 1E Zhang, Deqi, 18 Zhang, D. P., 0Y Zhang, Fu-min, 1E, 1V Zhang, Haitao, 25 Zhang, Hui, 0M, 11 Zhang, Jian, 04, 05 Zhang, Jiangzhou, 0X Zhang, Jianyan, 07 Zhang, Liansheng, 0J, 0S Zhang, Run, 0C Zhang, Shiwen, 0P Zhang, Shuai, 1T Zhang, Si-Qi, 28 Zhang, Tian, 06 Zhang, Tian-heng, 0D, 0E Zhang, Wei, 0W Zhang, Wen, 15 Zhang, Wen-Ying, 28 Zhang, Xiangchao, 03 Zhang, Yang, 0M, 11 Zhang, Yin, 0B Zhang, Yongbin, 22, 23, 24 Zhang, Yu, 13 Zhang, Yuanqi, 0V Zhang, Zhibo, 18 Zhao, Dongsheng, 04, 05 Zhao, Hui, 26 Zhao, Huining, 10 Zhao, Linchao, 0V Zhao, Qiancheng, 0W, 16, 19, 1A, 1B, 1C Zhao, Qihan, 0G Zhao, Shiping, 21 Zhao, Wenkai, 14 Zhao, Yibing, 0B Zheng, Huifeng, 1Y Zheng, Ji-hui, 1T Zheng, Renhao, 1P Zhong, Deqi, 18 Zhong, Siping, 18 Zhong, Ziqiang, 29 Zhou, Di, 11 Zhu, Anfeng, 16, 19 Zhu, Yifan, 03 Zuo, Heng, 0F Zuo, Rong, 1R, 1U Zuo, Xiaolin, 0A Conference CommitteesHonorary Conference Chairs Conference Chair International Committee Chair International Committee Co-chairs
Organizing Committee Chair Organizing Committee Co-chairs
Organizing Committee Members
Program Committee Chair Program Committee Members
Conference Secretariats
Session Chairs
IntroductionPrecision is the basis of manufacturing. With the development of science and technology and the improvement of requirements in manufacturing, precision engineering is becoming highly multidisciplinary covering mechanical, electrical, optical, control, and information disciplines. New methods, new technology, and new equipment for measuring are developing faster as well as innovative manufacturing. Micro and nano metrology are becoming practiced, and the requirement of traditional measurements including length, angular, coordination, vibration, and other physics parameters are calling for new technology. With this as the background, we have successfully held eight sessions of the International Symposium on Precision Mechanical Measurement (ISPMM). The subject and the major topics included length and angular measurement, coordinate measurement technology, micro-nano metrology and MEMS, sensor technology and application, online automatic measurement and control vibration, stress and thermal measurement, opto-electronic measurement and image processing, measurement signal analysis and processing, precision theory and uncertainty evaluation, quality engineering theory and technology, and so on. The 9th ISPMM conference was held 18-21 October in Chongqing, China. More than 150 abstracts were submitted to our conference, and more than 160 registered delegates participated in the conference. |
