Phase retrieval with deep learning (Conference Presentation)

Guohai Situ; Fei Wang; Yaoming Bian

doi:10.1117/12.2554922

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1 April 2020 Phase retrieval with deep learning (Conference Presentation)

Guohai Situ, Fei Wang, Yaoming Bian

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Proceedings Volume 11352, Optics and Photonics for Advanced Dimensional Metrology; 113520O (2020) https://doi.org/10.1117/12.2554922
Event: SPIE Photonics Europe, 2020, Online Only

Abstract

It is well known that neural networks including deep learning have been widely employed to solve the problems in recognition and classification. It was not until recently that people started to use them to solve imaging problems. In this talk, we focus on how to use deep learning to solve phase retrieval problems.

Conference Presentation

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Guohai Situ, Fei Wang, and Yaoming Bian "Phase retrieval with deep learning (Conference Presentation)", Proc. SPIE 11352, Optics and Photonics for Advanced Dimensional Metrology, 113520O (1 April 2020); https://doi.org/10.1117/12.2554922

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